In-Situ Thin Film Thickness / Deposition Rate Monitor with Software, and Optional Sensor, Quartz Crystals - TM106-LD Battery Electrode Fabrication This allows downloading data for

This allows downloading data for further analysis

(+/- 10%) with roughness: ~10 nm RMS as measured by the Wyko (white light interferometer) for 50 umx50 um area

Material:                                   Natural ABS With ESD Coating

or  heating plate into the chamber

In-Situ Thin Film Thickness / Deposition Rate Monitor with Software, and Optional Sensor, Quartz Crystals - TM106-LD Battery Electrode Fabrication This allows downloading data forEQ TM106 LD is a high precision thickness sensor monitor for the thin film deposition process. It is based on the principle that the mass of a deposited film on a quartz crystal can be measured by monitoring the change in crystals oscillating frequency. If the density of deposited material is known, the thickness can be determined to a high resolution of sub Angstrom (0. 037 for this equipment). SPECIFICATIONS: Power 5 VDC, 400 mA Frequency Range 6. 0