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E05200 - SEMI E52 - デジタルマスフローコントローラで使用されるガス,ガス混合物および気化して使用する材料の参照表 Revision:SEMI E52-0611 - Superseded Alternative methods may be used

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Alternative methods may be used as long as they comply with SEMI C1 guidelines for method validation

SEMI F61-0617 (complete rewrite)

This Document adapts structure and wording from other SEMI Documents

2  The specifications for epitaxial silicon wafers for integrated circuit applications are restricted to wafers of diameter of 100 mm or greater with epitaxial layer thickness less than or equal to 25 µm

E05200 - SEMI E52 - デジタルマスフローコントローラで使用されるガス,ガス混合物および気化して使用する材料の参照表 Revision:SEMI E52-0611 - Superseded Alternative methods may be usedglobal Gases Committee2011513global Audits and Reviews Subcommittee20116www. semiviews. org www. semi. org199520103 Referenced SEMI Standards None.

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