US$ 899.82
G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface This Standard was technically approved
$115.50
Description
This Standard was technically approved by the Flat Panel Display – Color Global Technical Committee
The purpose of this document is to provide a guide for evaluation of chemical-mechanical polishing (CMP) processes of thin films on unpatterned silicon substrates
through the oxide layers
Floating Zone (FZ) method for single crystal silicon wafers
G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface This Standard was technically approvedglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org199520023 : Referenced SEMI Standards SEMI G55 Test Method for Measurement of Silver Plating Brightness SEMI G56 Test Method for Measurement of Silver Plating Thickness
Shipping Notes
- Free Standard Shipping on $100+ Orders to the USA.
- Except Preorder products are shipped in 48 hours.
- Delivery to the USA:
- Standard Shipping : 3-10 business days
- If time is of the essence, please consider selecting expedited delivery for faster service.
You may also like
US$ 446.40
US$ 491.32
US$ 605.03
US$ 680.83
US$ 642.93
US$ 51.99
US$ 23.99
US$ 42.99
US$ 18.00
US$ 49.00
US$ 42.99